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1

Analog to digital conversion: technical aspects

Patrick Loumeau, Jean-François Naviner, Hervé Petit, Lirida Naviner, Patricia Desgreys

Journal:

annals of telecommunications - annales des télécommunications

Year:

2002

Language:

english

File:

PDF, 4.23 MB

english, 2002

2

[IEEE 2010 8th IEEE International NEWCAS Conference (NEWCAS) - Montreal, QC, Canada (2010.06.20-2010.06.23)] Proceedings of the 8th IEEE International NEWCAS Conference 2010 - A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Ban, Tian, de Barros Naviner, Lirida Alves

Year:

2010

Language:

english

File:

PDF, 209 KB

english, 2010

3

[IEEE 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Hong Kong (2018.7.8-2018.7.11)] 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - MRAM-on-FDSOI Integration: A Bit-Cell Perspective

Cai, Hao, Wang, You, Kang, Wang, Naviner, Lirida, Liu, Xinning, Yang, Jun, Zhao, Weisheng

Year:

2018

Language:

english

File:

PDF, 302 KB

english, 2018

4

Relevant metrics for evaluation of concurrent error detection schemes

de Vasconcelos, Maí C.R., Franco, Denis T., Naviner, Lirida A.B., Naviner, Jean-François

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 191 KB

english, 2008

5

Signal probability for reliability evaluation of logic circuits

Franco, Denis Teixeira, Vasconcelos, Maí Correia, Naviner, Lirida, Naviner, Jean-François

Journal:

Microelectronics Reliability

Year:

2008

Language:

english

File:

PDF, 278 KB

english, 2008

6

Progressive module redundancy for fault-tolerant designs in nanoelectronics

Tian Ban, Lirida Naviner

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 321 KB

english, 2011

7

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities

Flaquer, Josep Torras, Daveau, Jean Marc, Naviner, Lirida, Roche, Philippe

Year:

2011

Language:

english

File:

PDF, 762 KB

english, 2011

8

Cross-layer investigation of continuous-time sigma–delta modulator under aging effects

Cai, Hao, Wang, You, Liu, Kaikai, Naviner, Lirida Alves de Barros, Petit, Hervé, Naviner, Jean-François

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

9

[IEEE 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009 - Taipei, Taiwan (2009.05.24-2009.05.27)] 2009 IEEE International Symposium on Circuits and Systems - A 65 nm CMOS digital processor for multi-mode time interleaved high-pass ΣΔ A/D converters

Beydoun, Ali, Nguyen, Van-Tam, Naviner, Lirida, Loumeau, Patrick

Year:

2009

Language:

english

File:

PDF, 838 KB

english, 2009

10

Multiplexing Sense-Amplifier-Based Magnetic Flip-Flop in a 28-nm FDSOI Technology

Cai, Hao, Wang, You, Zhao, Weisheng, de Barros Naviner, Lirida Alves

Journal:

IEEE Transactions on Nanotechnology

Year:

2015

Language:

english

File:

PDF, 747 KB

english, 2015

11

Compact Model of Dielectric Breakdown in Spin-Transfer Torque Magnetic Tunnel Junction

Wang, You, Cai, Hao, Naviner, Lirida Alves de Barros, Zhang, Yue, Zhao, Xiaoxuan, Deng, Erya, Klein, Jacques-Olivier, Zhao, Weisheng

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.36 MB

english, 2016

12

Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

CAI, Hao, Wang, You, Naviner, Lirida, Zhao, Weisheng

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 2.64 MB

english, 2016

13

Exploring Hybrid STT-MTJ/CMOS Energy Solution in Near-/Sub-Threshold Regime for IoT Applications

Cai, Hao, Wang, You, de Barros Naviner, Lirida Alves, Yang, Jun, Zhao, Weisheng

Journal:

IEEE Transactions on Magnetics

Year:

2018

Language:

english

File:

PDF, 2.50 MB

english, 2018

14

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Enabling Resilient Voltage-Controlled MeRAM Using Write Assist Techniques

Cai, Hao, Wang, You, Kang, Wang, Naviner, Lirida, Shan, Weiwei, Yang, Jun, Zhao, Weisheng

Year:

2018

Language:

english

File:

PDF, 801 KB

english, 2018

15

Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy

Zhao, Weisheng, Zhao, Xiaoxuan, Zhang, Boyu, Cao, Kaihua, Wang, Lezhi, Kang, Wang, Shi, Qian, Wang, Mengxing, Zhang, Yu, Wang, You, Peng, Shouzhong, Klein, Jacques-Olivier, de Barros Naviner, Lirida,

Journal:

Year:

2016

Language:

english

File:

PDF, 4.18 MB

english, 2016

16

Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration

Cai, Hao, Wang, You, Naviner, Lirida Alves de Barros, Liu, Xinning, Shan, Weiwei, Yang, Jun, Zhao, Weisheng

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2018

Language:

english

File:

PDF, 4.60 MB

english, 2018

17

Voltage-Controlled Magnetic Anisotropy MeRAM Bit-Cell over Event Transient Effects

Maciel, Nilson, Marques, Elaine, Naviner, Lirida, Cai, Hao, Yang, Jun

Journal:

Journal of Low Power Electronics and Applications

Year:

2019

File:

PDF, 703 KB

2019

18

Yield and reliability issues in nanoelectronic technologies

Denis Teixeira Franco, Jean-François Naviner, Lirida Naviner

Journal:

annals of telecommunications - annales des télécommunications

Year:

2006

File:

PDF, 4.46 MB

2006

19

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Reliability analysis of logic circuits based on signal probability

Franco, Denis Teixeira, Correia Vasconcelos, Mai, Naviner, Lirida, Naviner, Jean-Francois

Year:

2008

Language:

english

File:

PDF, 243 KB

english, 2008

20

[IEEE 2010 17th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2010) - Athens, Greece (2010.12.12-2010.12.15)] 2010 17th IEEE International Conference on Electronics, Circuits and Systems - Handling reconvergent paths using conditional probabilities in combinatorial logic netlist reliability estimation

Torras Flaquer, Josep, Daveau, Jean-Marc, Naviner, Lirida, Roche, Philippe

Year:

2010

Language:

english

File:

PDF, 794 KB

english, 2010

21

Optimal digital reconstruction and calibration for multichannel Time Interleaved ΣΔ ADC based on Comb-filters

Beydoun, Ali, Nguyen, Van-Tam, Naviner, Lirida, Loumeau, Patrick

Journal:

AEU - International Journal of Electronics and Communications

Year:

2013

Language:

english

File:

PDF, 2.04 MB

english, 2013

22

[IEEE 2012 IEEE 17th International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD) - Barcelona, Spain (2012.09.17-2012.09.19)] 2012 IEEE 17th International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD) - Green solutions for future LTE PMR networks

Masbernat, Xavier Pons, Gruet, Christophe, Fraysse, Frederic, Contal, Serge, Naviner, Lirida

Year:

2012

Language:

english

File:

PDF, 89 KB

english, 2012

23

[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Majority voter: Signal probability, reliability and error bound characteristics

Ban, Tian, de Barros Naviner, Lirida Alves

Year:

2012

Language:

english

File:

PDF, 327 KB

english, 2012

24

[IEEE 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA) - Toulouse, France (2009.06.28-2009.07.1)] 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference - A 65 nm CMOS versatile ADC using time interleaving and ΣΔ modulation for multi-mode receiver

Beydoun, Ali, Jabbour, Chadi, Fakhoury, Hussein, Nguyen, Van-Tam, Naviner, Lirida, Loumeau, Patrick

Year:

2009

Language:

english

File:

PDF, 893 KB

english, 2009

25

[IEEE 2014 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2014.5.28-2014.5.30)] 2014 IEEE International Conference on IC Design & Technology - Cross logic: A new approach for defect-tolerant circuits

Slimani, Mariem, Ben Dhia, Arwa, Naviner, Lirida

Year:

2014

Language:

english

File:

PDF, 677 KB

english, 2014

26

[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Reliability analysis of a Reed-Solomon decoder

Liu, Kaikai, Ban, Tian, Naviner, Lirida, Naviner, Jean-Francois

Year:

2012

Language:

english

File:

PDF, 143 KB

english, 2012

27

[IEEE 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - Paris, France (2013.06.16-2013.06.19)] 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - Selective hardening against multiple faults employing a net-based reliability analysis

Pagliarini, Samuel N., de B. Naviner, Lirida A., Naviner, Jean-Francois

Year:

2013

Language:

english

File:

PDF, 847 KB

english, 2013

28

[IEEE 2012 19th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2012) - Seville, Seville, Spain (2012.12.9-2012.12.12)] 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Parallel scaling-free and area-time efficient CORDIC algorithm

Causo, Matteo, An, Ting, Alves de Barros Naviner, Lirida

Year:

2012

Language:

english

File:

PDF, 474 KB

english, 2012

29

[IEEE 2014 21st International Conference "Mixed Design of Integrated Circuits & Systems" (MIXDES) - Lublin (2014.6.19-2014.6.21)] 2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) - Efficient implementation for accurate analysis of CED circuits against multiple faults

Ting An,, Kaikai Liu,, Hao Cai,, de Barros Naviner, Lirida Alves

Year:

2014

Language:

english

File:

PDF, 287 KB

english, 2014

30

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Reliability analysis of combinational circuits with the influences of noise and single-event transients

Liu, Kaikai, Cai, Hao, An, Ting, Naviner, Lirida, Naviner, Jean-Francois, Petit, Herve

Year:

2013

Language:

english

File:

PDF, 480 KB

english, 2013

31

[IEEE 2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Tampa, FL, USA (2014.7.9-2014.7.11)] 2014 IEEE Computer Society Annual Symposium on VLSI - Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA

Rehman, Saif Ur, Blanchardon, Adrien, Dhia, Arwa Ben, Benabdenbi, Mounir, Chotin-Avot, Roselyne, Naviner, Lirida, Anghel, Lorena, Mehrez, Habib, Amouri, Emna, Marrakchi, Zied

Year:

2014

Language:

english

File:

PDF, 385 KB

english, 2014

32

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Evaluating CLB designs under multiple SETs in SRAM-based FPGAs

Dhia, Arwa Ben, Naviner, Lirida, Matherat, Philippe

Year:

2013

Language:

english

File:

PDF, 195 KB

english, 2013

33

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Comparative study of defect-tolerant multiplexers for FPGAs

Ben Dhia, Arwa, Slimani, Mariem, Naviner, Lirida

Year:

2014

Language:

english

File:

PDF, 185 KB

english, 2014

34

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix

Ezzat, Hicham, Naviner, Lirida

Year:

2010

Language:

english

File:

PDF, 311 KB

english, 2010

35

[IEEE 2013 IEEE 18th International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD) - Berlin, Germany (2013.09.25-2013.09.27)] 2013 IEEE 18th International Workshop on Computer Aided Modeling and Design of Communication Links and Networks (CAMAD) - Uplink energy efficiency in LTE systems

Pons, Xavier, Palacios, Raul, Gruet, Christophe, Naviner, Lirida, Marques, Hugo, Granelli, Fabrizio, Rodriguez, Jonathan

Year:

2013

Language:

english

File:

PDF, 736 KB

english, 2013

36

[IEEE 2014 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2014.5.28-2014.5.30)] 2014 IEEE International Conference on IC Design & Technology - Efficient computation of combinational circuits reliability based on probabilistic transfer matrix

Naviner, Lirida, Liu, Kaikai, Cai, Hao, Naviner, Jean-Francois

Year:

2014

Language:

english

File:

PDF, 554 KB

english, 2014

37

[IEEE 2014 21st International Conference "Mixed Design of Integrated Circuits & Systems" (MIXDES) - Lublin (2014.6.19-2014.6.21)] 2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) - A defect-tolerant multiplexer using differential logic for FPGAs

Ben Dhia, Arwa, Slimani, Mariem, Naviner, Lirida

Year:

2014

Language:

english

File:

PDF, 151 KB

english, 2014

38

[IEEE 2013 14th Latin American Test Workshop - LATW - Cordoba, Argentina (2013.04.3-2013.04.5)] 2013 14th Latin American Test Workshop - LATW - Comparison of fault-tolerant fabless CLBs in SRAM-based FPGAs

Dhia, Arwa Ben, Naviner, Lirida, Matherat, Philippe

Year:

2013

Language:

english

File:

PDF, 1.96 MB

english, 2013

39

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - A hybrid reliability assessment method and its support of sequential logic modelling

Pagliarini, Samuel N., Naviner, Lirida A. de B., Naviner, Jean-Francois, Pradhan, Dhiraj

Year:

2014

Language:

english

File:

PDF, 130 KB

english, 2014

40

[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Improving the robustness of a switch box in a mesh of clusters FPGA

Ben Dhia, Arwa, Slimani, Mariem, Naviner, Lirida

Year:

2014

Language:

english

File:

PDF, 155 KB

english, 2014

41

[IEEE 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Opatija, Croatia (2014.5.26-2014.5.30)] 2014 37th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Analytical method for reliability assessment of concurrent checking circuits under multiple faults

An, Ting, Liu, Kaikai, de Barros Naviner, Lirida Alves

Year:

2014

Language:

english

File:

PDF, 854 KB

english, 2014

42

[IEEE 2012 19th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2012) - Seville, Seville, Spain (2012.12.9-2012.12.12)] 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - A new fault-tolerant architecture for CLBs in SRAM-based FPGAs

Ben Dhia, Arwa, Naviner, Lirida, Matherat, Philippe

Year:

2012

Language:

english

File:

PDF, 481 KB

english, 2012

43

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster

Dhia, Arwa Ben, Naviner, Lirida, Matherat, Philippe

Year:

2012

Language:

english

File:

PDF, 255 KB

english, 2012

44

[IEEE 2012 19th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2012) - Seville, Seville, Spain (2012.12.9-2012.12.12)] 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) - Transient fault analysis of CORDIC processor

An, Ting, Causo, Matteo, Alves de Barros Naviner, Lirida, Matherat, Philippe

Year:

2012

Language:

english

File:

PDF, 539 KB

english, 2012

45

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Flip-Flop Selection for In-Situ Slack-Time Monitoring based on the Activation Probability of Timing-Critical Paths

Sarrazin, Sebastien, Evain, Samuel, Miro-Panades, Ivan, de Barros Naviner, Lirida Alves, Gherman, Valentin

Year:

2014

Language:

english

File:

PDF, 184 KB

english, 2014

46

[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - Efficient computation of logic circuits reliability based on Probabilistic Transfer Matrix

Naviner, Lirida A. B., de Vasconcelos, Mai C. R., Franco, Denis T., Naviner, Jean-Francois

Year:

2008

Language:

english

File:

PDF, 193 KB

english, 2008

47

[IEEE 2008 Joint International IEEE Northeast Workshop on Circuits and Systems (NEWCAS) and TAISA Conference (NEWCAS-TAISA) - Montreal, QC, Canada (2008.06.22-2008.06.25)] 2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems and TAISA Conference - Reliability analysis of combinational circuits based on a probabilistic binomial model

de Vasconcelos, Mai C. R., Franco, Denis T., de B. Naviner, Lirida A., Naviner, Jean-Francois

Year:

2008

Language:

english

File:

PDF, 348 KB

english, 2008

48

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Shadow-scan design with low latency overhead and in-situ slack-time monitoring

Sarrazin, Sebastien, Evain, Samuel, Miro-Panades, Ivan, Valentian, Alexandre, Pajaniradja, Suresh, de Barros Naviner, Lirida Alves, Gherman, Valentin

Year:

2014

Language:

english

File:

PDF, 293 KB

english, 2014

49

[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Single event transient mitigation through pulse quenching: Effectiveness at circuit level

Pagliarini, Samuel N., Naviner, Lirida A. de B., Naviner, Jean-Francois

Year:

2013

Language:

english

File:

PDF, 396 KB

english, 2013

50

[IEEE 2013 International Conference on Field-Programmable Technology (FPT) - Kyoto, Japan (2013.12.9-2013.12.11)] 2013 International Conference on Field-Programmable Technology (FPT) - A defect-tolerant cluster in a mesh SRAM-based FPGA

Ben Dhia, Arwa, Rehman, Saif Ur, Blanchardon, Adrien, Naviner, Lirida, Benabdenbi, Mounir, Chotin-Avot, Roselyne, Mehrez, Habib, Amouri, Emna, Marrakchi, Zied

Year:

2013

Language:

english

File:

PDF, 195 KB

english, 2013